Materials analysis with monolayer depth resolution using MeV ion beams
2001
Conference Paper
mms
Author(s): | Carstanjen, H. D. |
Journal: | {Journal of Materials Processing Technology} |
Volume: | 117 |
Year: | 2001 |
Department(s): | Modern Magnetic Systems |
Bibtex Type: | Conference Paper (inproceedings) |
Address: | Las Vegas, USA |
Language: | eng |
BibTex @inproceedings{escidoc:0901, title = {{Materials analysis with monolayer depth resolution using MeV ion beams}}, author = {Carstanjen, H. D.}, journal = {{Journal of Materials Processing Technology}}, volume = {117}, address = {Las Vegas, USA}, year = {2001}, doi = {} } |