Search results

Journal Article (8)

  1. 1.
    Vayalamkuzhi, P.; Bhattacharya, S.; Eigenthaler, U.; Keskinbora, K.; Salman, C. T.; Hirscher, M.; Spatz, J. P.; Viswanathan, N. K.: Direct patterning of vortex generators on a fiber tip using a focused ion beam. Optics Letters 41 (10), pp. 2133 - 2136 (2016)
  2. 2.
    Vijayakumar, A.; Eigenthaler, U.; Keskinbora, K.; Sridharan, G. M.; Pramitha, V.; Hirscher, M.; Spatz, J. P.; Bhattacharya, S.: Optimizing the fabrication of diffractive optical elements using a focused ion beam system. Proceedings of SPIE 9130, 91300X (2014)
  3. 3.
    Keskinbora, K.; Grévent, C.; Eigenthaler, U.; Weigand, M.; Schütz, G.: Rapid prototyping of Fresnel zone plates via direct Ga+ ion beam lithography for high-resolution x-ray imaging. ACS Nano 7 (11), pp. 9788 - 9797 (2013)
  4. 4.
    Faridian, A.; Hopp, D.; Pedrini, G.; Eigenthaler, U.; Hirscher, M.; Osten, W.: Nanoscale imaging using deep ultraviolet digital holographic microscopy. Optics Express 18 (13), pp. 14159 - 14164 (2010)
  5. 5.
    Liu, N.; Weiss, T.; Mesch, M.; Langguth, L.; Eigenthaler, U.; Hirscher, M.; Sönnichsen, C.; Giessen, H.: Planar metamaterial analogue of electromagnetically induced transparancy for plasmonic sensing. Nano Letters 10, pp. 1103 - 1107 (2010)
  6. 6.
    Deneke, C.; Sigle, W.; Eigenthaler, U.; van Aken, P. A.; Schütz, G.; Schmidt, O. G.: Interfaces in semiconductor/metal radial superlattices. Applied Physics Letters 90, 263107 (2007)
  7. 7.
    Sigle, W.; Krämer, S.; Varshney, V.; Zern, A.; Eigenthaler, U.; Rühle, M.: Plasmon energy mapping in energy-filtering transmission electron microscopy. Ultramicroscopy 96, pp. 565 - 571 (2003)
  8. 8.
    Sigle, W.; Zern, A.; Hahn, K.; Eigenthaler, U.; Rühle, M.: Advances in energy-filtering transmission electron microscopy. Journal of Electron Microscopy 50 (6), pp. 509 - 515 (2001)

Conference Paper (2)

  1. 9.
    Rahmati, B.; Sigle, W.; Fleig, J.; Konuma, M.; Eigenthaler, U.; Koch, C.; van Aken, P. A.; Rühle, M.: Effect of surface orientation on island formation on SrTiO3 surfaces. E-MRS Spring Meeting 2007, Strasbourg, France, May 28, 2007 - June 01, 2007. Interfacial Nanostructures in Ceramics: a Multiscale Approach, (2008)
  2. 10.
    Sigle, W.; Krämer, S.; Zern, A.; Cai, Y.; Eigenthaler, U.; Hahn, K.; Rühle, M.: The SESAM Project - Present State and Applications. In: Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1, pp. 329 - 330 (Eds. Engelbrecht, J.; Sevell, T.; Witcomb, M.; Cross, R.; Richards, P.). ICEM 15. 15th International Congress on Electron Microscopy, Durban [South Africa], September 01, 2002 - September 06, 2002. Microscopy Society of Southern Africa, Onderstepoort (2002)
 
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