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{Nanoscale detection of spin wave deflection angles in permalloy}

2019

Article

mms


Magnonics is a potential candidate for beyond CMOS and neuromorphic computing technologies with advanced phase encoded logic. However, nanoscale imaging of spin waves with full phase and magnetization amplitude information is a challenge. We show a generalized scanning transmission x-ray microscopy platform to get a complete understanding of spin waves, including the k-vector, phase, and absolute magnetization deflection angle. As an example, this is demonstrated using a 50 nm thin permalloy film where we find a maximum deflection angle of 1.5° and good agreement with the k-vector dispersion previously reported in the literature. With a spatial resolution approximately ten times better than any other methods for spin wave imaging, x-ray microscopy opens a vast range of possibilities for the observation of spin waves and various magnetic structures.

Author(s): Gross, F. and Träger, N. and Förster, J. and Weigand, M. and Schütz, G. and Gräfe, J.
Journal: {Applied Physics Letters}
Volume: 114
Number (issue): 1
Year: 2019
Publisher: American Institute of Physics

Department(s): Modern Magnetic Systems
Bibtex Type: Article (article)

Address: Melville, NY
DOI: 10.1063/1.5074169
Language: eng

BibTex

@article{escidoc:3018734,
  title = {{Nanoscale detection of spin wave deflection angles in permalloy}},
  author = {Gross, F. and Tr\"ager, N. and F\"orster, J. and Weigand, M. and Sch\"utz, G. and Gr\"afe, J.},
  journal = {{Applied Physics Letters}},
  volume = {114},
  number = {1},
  publisher = {American Institute of Physics},
  address = {Melville, NY},
  year = {2019}
}