Header logo is

Microstructural dependence of the fracture toughness of metallic thin films: A bulge test and atomistic simulation study on single-crystalline and polycrystalline silver films

2019

Article

zwe-csfm


Author(s): Preiss, E. I. and Lyu, H. and Liebig, J. P. and Richter, G. and Gannott, F. and Gruber, P. A. and Goken, M. and Bitzek, E. and Merle, B.
Journal: Journal of Materials Research
Volume: 34
Number (issue): 20
Pages: 3483--3494
Year: 2019

Department(s): CSF Materials
Bibtex Type: Article (article)

DOI: 10.1557/jmr.2019.262

BibTex

@article{escidoc:4123465,
  title = {Microstructural dependence of the fracture toughness of metallic thin films: A bulge test and atomistic simulation study on single-crystalline and polycrystalline silver films},
  author = {Preiss, E. I. and Lyu, H. and Liebig, J. P. and Richter, G. and Gannott, F. and Gruber, P. A. and Goken, M. and Bitzek, E. and Merle, B.},
  journal = {Journal of Materials Research},
  volume = {34},
  number = {20},
  pages = {3483--3494},
  year = {2019},
  doi = {10.1557/jmr.2019.262}
}