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2011


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Automated Control of AFM Based Nanomanipulation

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 237-311, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

2011


[BibTex]


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Teleoperation Based AFM Manipulation Control

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 145-235, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


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Descriptions and challenges of AFM based nanorobotic systems

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 13-29, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


Benchmark datasets for pose estimation and tracking
Benchmark datasets for pose estimation and tracking

Andriluka, M., Sigal, L., Black, M. J.

In Visual Analysis of Humans: Looking at People, pages: 253-274, (Editors: Moesland and Hilton and Kr"uger and Sigal), Springer-Verlag, London, 2011 (incollection)

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publisher's site Project Page [BibTex]

publisher's site Project Page [BibTex]


Fields of experts
Fields of experts

Roth, S., Black, M. J.

In Markov Random Fields for Vision and Image Processing, pages: 297-310, (Editors: Blake, A. and Kohli, P. and Rother, C.), MIT Press, 2011 (incollection)

Abstract
Fields of Experts are high-order Markov random field (MRF) models with potential functions that extend over large pixel neighborhoods. The clique potentials are modeled as a Product of Experts using nonlinear functions of many linear filter responses. In contrast to previous MRF approaches, all parameters, including the linear filters themselves, are learned from training data. A Field of Experts (FoE) provides a generic, expressive image prior that can capture the statistics of natural scenes, and can be used for a variety of machine vision tasks. The capabilities of FoEs are demonstrated with two example applications, image denoising and image inpainting, which are implemented using a simple, approximate inference scheme. While the FoE model is trained on a generic image database and is not tuned toward a specific application, the results compete with specialized techniques.

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publisher site [BibTex]

publisher site [BibTex]


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Applications of AFM Based Nanorobotic Systems

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 313-342, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


Steerable random fields for image restoration and inpainting
Steerable random fields for image restoration and inpainting

Roth, S., Black, M. J.

In Markov Random Fields for Vision and Image Processing, pages: 377-387, (Editors: Blake, A. and Kohli, P. and Rother, C.), MIT Press, 2011 (incollection)

Abstract
This chapter introduces the concept of a Steerable Random Field (SRF). In contrast to traditional Markov random field (MRF) models in low-level vision, the random field potentials of a SRF are defined in terms of filter responses that are steered to the local image structure. This steering uses the structure tensor to obtain derivative responses that are either aligned with, or orthogonal to, the predominant local image structure. Analysis of the statistics of these steered filter responses in natural images leads to the model proposed here. Clique potentials are defined over steered filter responses using a Gaussian scale mixture model and are learned from training data. The SRF model connects random fields with anisotropic regularization and provides a statistical motivation for the latter. Steering the random field to the local image structure improves image denoising and inpainting performance compared with traditional pairwise MRFs.

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publisher site [BibTex]

publisher site [BibTex]


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Nanomechanics of AFM based nanomanipulation

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 87-143, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


Model-Based Pose Estimation
Model-Based Pose Estimation

Pons-Moll, G., Rosenhahn, B.

In Visual Analysis of Humans: Looking at People, pages: 139-170, 9, (Editors: T. Moeslund, A. Hilton, V. Krueger, L. Sigal), Springer, 2011 (inbook)

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book page pdf [BibTex]

book page pdf [BibTex]


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Instrumentation Issues of an AFM Based Nanorobotic System

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 31-86, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]