Max Planck Institute for Intelligent Systems


Scientific Publications

since 2011: MPI for Intelligent Systems
2010 and older: MPI for Metals Research

Conference Paper (967)

  1. 2000
    Pundt, A.; Laudahn, U.; von Hülsen, U.; Geyer, U.; Wagner, T.; Getzlaff, M.; Bode, M.; Wiesendanger, R.; Kirchheim, R.: Hydrogen induced plastic deformation of thin films. In: Thin Films: Stresses and Mechanical Properties III, pp. 75 - 86 (Eds. Vinci, R. P.; O. Kraft, N.; Moody, N.; Besser, P.; Shaffer, E.). Thin Films: Stresses and Mechanical Properties III. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., November 29, 1999 - December 03, 1999. Materials Research Society, Warrendale/PA (2000)
  2. Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, pp. 414 - 417 (Eds. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], May 05, 2000 - May 11, 2000. (2000)
  3. Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, pp. 414 - 417 (Eds. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], May 05, 2000 - May 11, 2000. (2000)
  4. Russew, K.; Sommer, F.: Relaxation phenomena in the Al7.5Cu17.5Ni10Zr65 bulk metallic glass studied by bend stress and anelastic strain relaxation under isothermal and non-isothermal conditions. In: Materials Development and Processing - Bulk Amorphous Materials, Undercooling and Powder Metallurgy, Euromat 99, Vol. 8, pp. 57 - 64 (Eds. Wood, J. W.; Schultz, L.; Herlach, D. M.). Euromat 99. European Congress on Advanced Materials and Processes, München, September 27, 1999 - September 30, 1999. Wiley-VCH, Weinheim (2000)
  5. Russew, K.; Stojanowa, L.; Sommer, F.: Viscosity and thermal expansion of the Al7.5Cu17.5Ni10Zr65 bulk metallic glass materials development and processing-bulk amorphous materials undercooling and powder metallurgy. In: Materials Development and Processing - Bulk Amorphous Materials, Undercooling and Powder Metallurgy, Euromat 99, Vol. 8, pp. 65 - 70 (Eds. Wood, J. W.; Schultz, L.; Herlach, D. M.). Euromat 99. European Congress on Advanced Materials and Processes, München, September 27, 1999 - September 30, 1999. Wiley-VCH, Weinheim (2000)
  6. Rühle, M.; Elsässer, C.; Scheu, C.; Sigle, W.: The role of microanalysis in the characterization of interfaces. In: Microbeam Analysis 2000: Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies, pp. 1 - 2 (Eds. Williams, D. B.; Shimizu, R.). Microbeam Analysis 2000. Second Conference of the International Union of Microbeam Analysis Societies, Kailua-Kona, Hawai, July 09, 2000 - July 14, 2007. Institute of Physics Publ., Bristol (2000)
  7. Rühle, M.; Elsässer, C.; Scheu, C.; Sigle, W.: Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)? In: Microscopy and Microanalysis 2000, pp. 188 - 189 (Ed. Bailey, G.W.). Microscopy and Microanalysis 2000, Philadelphia, Pa., August 13, 2000 - August 17, 2000. Springer, New York (2000)
  8. Scheu, C.; Stein, W.; Schweinfest, R.; Wagner, T.; Rühle, M.: A combined approach of analytical and high-resolution TEM to determine the interface structure of Cu/(1120) α-Al2O3. In: Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2: Physical Sciences, pp. 413 - 414 (Eds. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy, Brno/Czech Republic, July 09, 2000 - July 14, 2000. Czechoslovak Society for Electron Microscopy (2000)
  9. Scheu, C.; Stein, W.; Schweinfest, R.; Wagner, T.; Rühle, M.: Atomic structure and bonding of epitaxial Cu films on (110) a-Al2O3. In: Proceedings Microscopy and Microanalysis 2000, pp. 182 - 183 (Ed. Bailey, G.W.). Microscopy and Microanalysis 2000, Philadelphia, Pa., August 17, 2000 - August 20, 2000. Springer, New York (2000)
  10. Schwaiger, R.; Kraft, O.: Fatigue behaviour of thin silver films investigated by dynamic microbeam deflection. In: Thin Films: Stresses and Mechanical Properties VIII, pp. 201 - 206 (Eds. Vinci, R.; Kraft, O.; Moody, N.; Besser, P.; Shaffer II, E.). Thin Films: Stresses and Mechanical Properties VIII. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., November 29, 1999 - December 03, 1999. Materials Research Society, Warrendale/PA (2000)
  11. Seeger, A.: Scattering by the two-dimensional potential sinφ/r. In: Day on Diffraction. Proceedings of the International Seminar "Day of Diffraction 2000", pp. 134 - 142 (Ed. Andronov, I. V.). Day on Diffraction. Millennium Workshop, St. Petersburg, Russia, May 29, 2000 - June 01, 2000. (2000)
  12. Seifert, H. J.: Thermodynamics of ceramic materials. In: High Temperature Materials Chemistry (HTMC-X). Proceedings IUPAC Conference, pp. 37 - 42 (Eds. Hilpert, K.; Froben, F. W.; Singheiser, L.). High Temperature Materials Chemistry (HTMC-X), Jülich, Germany, October 04, 2000 - October 14, 2000. Forschungszentrum Jülich GmbH, Jülich (2000)
  13. Slavyanov, S.; Ern, C.; Dosch, H.: Rigorous mathematical models for the reconstruction of thin films profiles from X-ray intensities. In: Proceedings of Days of Diffraction, pp. 161 - 167 (Ed. Andronov, I. V.). SPbU, St. Petersburg/Russia (2000)
  14. Sommadossi, S.; Khanna, P. K.; Bhatnagar, S. K.; Litynska, L.; Zieba, P.; Gust, W.; Mittemeijer, E. J.: Development of Cu/Cu interconnections using an indium interlayer. In: Euromat 99. 6th European Congress on Advanced Materials and Processes. Vol. 4, pp. 214 - 218 (Eds. Jouffray, B.; Svejcar, J.). EUROMAT 99, 6th European Congress on Advanced Materials and Processes, München, September 27, 1999 - September 30, 1999. Wiley-VCH, Weinheim (2000)
  15. Sturm, S.; Recnik, A.; Scheu, C.; Ceh, M.: EDS study of planar faults in SrO doped SrTiO3. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, pp. 221 - 222 (Eds. Gemperlova, J.; Vavra, I.). Proceedings of the 12th European Congress on Electron Microscopy, Brno/Czech Republic, July 09, 2000 - July 14, 2000. Czechoslovak Society for Electron Microscopy (2000)
  16. Tas, A. C.; Schluckwerder, H.; Majewski, P. J.; Aldinger, F.: Chemical synthesis of pure and doped LaGaO3 powders of oxide fuel cells by amorphous citrate/EG method. In: Chemical Processing of Dielectrics, Insulators and Electronic Ceramics, pp. 237 - 243 (Ed. Jones, A. J.). Chemical Processing of Dielectrics, Insulators and Electronic Ceramics. Symposium NN held at the 1999 MRS Fall Meeting, Boston, Mass., November 29, 1999 - December 01, 1999. Materials Research Society, Warrendale/PA (2000)
  17. Wagner, T.; Müller, D.: Microstructural evolution of ion-bombarded copper thin films. In: Fundamental Mechanisms of Low-Energy-Beam-Modified Surface Growth and Processing, pp. 85 - 90 (Ed. Moss, S.). Fundamental Mechanisms of Low-Energy-Beam-Modified Surface Growth and Processing. Symposium, Boston, Mass, November 29, 1999 - December 01, 1999. Materials Research Society, Warrendale/PA (2000)
  18. Zhang, Y. W.; Hadjipanayis, G. C.; Goll, D.; Kronmüller, H.; Chen, C.; Nelson, C.; Krishnan, K.: Evolution of microstructure and microchemistry in the high-temperature Sm(Co, Fe, Cu, Zr)z magnets. In: Proceedings of the 16th International Workshop on Rare-Earth Magnets and Their Applications, pp. 169 - 178 (Eds. Kaneko, H.; Homma, M.; Okada, M.). 16th International Workshop on Rare-Earth Magnets and Their Applications, Sendai, Japan, September 10, 2000 - September 13, 2000. (2000)
  19. van Benthem, K.; Scheu, C.; Sigle, W.; Rühle, M.: Electronic structure investigations of metal/strontiumtitanate interfaces. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, pp. 421 - 422 (Eds. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], July 09, 2000 - July 14, 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
  20. 1999
    Möbus, R.; Kienzle, O.: Interface structure revieval by HREM: from entropy maximisation to R-Factor fits. In: Electron Microscopy and Analysis 1999, pp. 263 - 266 (Ed. Kiely, C. J.). Electron Microscopy and Analysis 1999, Sheffield, August 24, 1999 - August 27, 1999. Institute of Physics Publ., Bristol (1999)
 
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