Max Planck Institute for Intelligent Systems


Scientific Publications

since 2011: MPI for Intelligent Systems
2010 and older: MPI for Metals Research

Journal Article (8)

  1. 1999
    Chang, L.-S.; Rabkin, E.; Straumal, B.; Baretzky, B.; Gust, W.: Kinetics of the Bi segregation at grain boundaries in polycrystalline Cu. Materials Science Forum 294-296, pp. 585 - 588 (1999)
  2. Han, W. Q.; Kohler-Redlich, P.; Ernst, F.; Rühle, M.: Formation of (BN)xCy and BN nanotubes filled with boron carbide nanowires. Chemistry of Materials 11, pp. 3620 - 3623 (1999)
  3. Hofmann, S.: From depth resolution to depth resolution function: Refinement of the concept for delta layers, single layers and multilayers. Surface Interface Analysis 27, pp. 825 - 834 (1999)
  4. Lejcek, P.; Paidar, V.; Hofmann, S.: Special [100] tilt grain boundaries in iron: A segregation study. Materials Science Forum 294-296, 106, pp. 103 (1999)
  5. Pojtinger, A.; Lamparter, P.; Steeb, S.: Medium range structure of hydrogenated amorphous Ti84Si16. Zeitschrift für Naturforschung 54a, pp. 699 - 703 (1999)
  6. Pojtinger, A.; Lamparter, P.; Steeb, S.: Structure of sputtered amorphous Zr-Hf-Si alloys. Zeitschrift für Naturforschung 54a, pp. 699 - 703 (1999)
  7. Rar, A.; Kojima, I.; Moon, D.W.; Hofmann, S.: Original and sputtering induced interface roughness in AES sputter depth profiling of SiO2/Ta2O5 multilayers. Thin Solid Films 355-356, pp. 390 - 394 (1999)
  8. Suzuki, S.; Lejcek, P.; Hofmann, S.: Effect of metallurgical factors on grain boundary segregation of solute atoms in iron. Materials Trans. JIM 40, pp. 463 - 473 (1999)

Book Chapter (2)

  1. Rühle, M.; Gemming, T.; Kienzle, O.; Schweinfest, R.: Interface science - knowing more about less. In: Electron Microscopy and Analysing 1999, pp. 1 - 8. Institute of Physics Publishing, Bristol (1999)
  2. Weiss, D.; Kraft, O.; Arzt, E.: Microstructural development of dispersion strengthened Cu thin films. In: Polycrystalline Metal and Magnetic Thin Films, pp. 257 - 262. Materials Research Society, Warrendale/PA (1999)

Conference Paper (3)

  1. Möbus, R.; Kienzle, O.: Interface structure revieval by HREM: from entropy maximisation to R-Factor fits. In: Electron Microscopy and Analysis 1999, pp. 263 - 266 (Ed. Kiely, C. J.). Electron Microscopy and Analysis 1999, Sheffield, August 24, 1999 - August 27, 1999. Institute of Physics Publ., Bristol (1999)
  2. Näfe, H.; Gollhofer, S.; Aldinger, F.: Mixed ionic-electronic conduction of Na-beta-alu mina under the conditions of a potentiometric CO2 sensor. In: Solid State Ionics V, pp. 521 - 526 (Eds. Nazri, G.-A.; Julien, C.; Rougler, A.). Symposium at the Materials Research Society Fall Meeting, Boston, November 30, 1998 - December 04, 1998. Materials Research Society, Warrendale, PA (1999)
  3. Ritsch, S.; Hiraga, K.; Gödecke, T.; Lück, R.: Phase transformations in decagonal Al-Co-Ni quasicrystals studied by TEM. In: Proceedings of the International Conference on Solid-Solid Transformations '99 (JIMIC 3), pp. 1341 - 1344. Solid-Solid Transformations '99 (JIMIC 3), Kyoto, Japan, April 24, 1999 - April 28, 1999. Japan Institute of Metals, Sendai (1999)
 
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