Max-Planck-Institut für Intelligente Systeme


Wissenschaftliche Veröffentlichungen

ab 2011: MPI für Intelligente Systeme
2010 und älter: MPI für Metallforschung

Zeitschriftenartikel (8)

  1. 1999
    Chang, L.-S.; Rabkin, E.; Straumal, B.; Baretzky, B.; Gust, W.: Kinetics of the Bi segregation at grain boundaries in polycrystalline Cu. Materials Science Forum 294-296, S. 585 - 588 (1999)
  2. Han, W. Q.; Kohler-Redlich, P.; Ernst, F.; Rühle, M.: Formation of (BN)xCy and BN nanotubes filled with boron carbide nanowires. Chemistry of Materials 11, S. 3620 - 3623 (1999)
  3. Hofmann, S.: From depth resolution to depth resolution function: Refinement of the concept for delta layers, single layers and multilayers. Surface Interface Analysis 27, S. 825 - 834 (1999)
  4. Lejcek, P.; Paidar, V.; Hofmann, S.: Special [100] tilt grain boundaries in iron: A segregation study. Materials Science Forum 294-296, 106, S. 103 (1999)
  5. Pojtinger, A.; Lamparter, P.; Steeb, S.: Medium range structure of hydrogenated amorphous Ti84Si16. Zeitschrift für Naturforschung 54a, S. 699 - 703 (1999)
  6. Pojtinger, A.; Lamparter, P.; Steeb, S.: Structure of sputtered amorphous Zr-Hf-Si alloys. Zeitschrift für Naturforschung 54a, S. 699 - 703 (1999)
  7. Rar, A.; Kojima, I.; Moon, D.W.; Hofmann, S.: Original and sputtering induced interface roughness in AES sputter depth profiling of SiO2/Ta2O5 multilayers. Thin Solid Films 355-356, S. 390 - 394 (1999)
  8. Suzuki, S.; Lejcek, P.; Hofmann, S.: Effect of metallurgical factors on grain boundary segregation of solute atoms in iron. Materials Trans. JIM 40, S. 463 - 473 (1999)

Buchkapitel (2)

  1. Rühle, M.; Gemming, T.; Kienzle, O.; Schweinfest, R.: Interface science - knowing more about less. In: Electron Microscopy and Analysing 1999, S. 1 - 8. Institute of Physics Publishing, Bristol (1999)
  2. Weiss, D.; Kraft, O.; Arzt, E.: Microstructural development of dispersion strengthened Cu thin films. In: Polycrystalline Metal and Magnetic Thin Films, S. 257 - 262. Materials Research Society, Warrendale/PA (1999)

Konferenzbeitrag (3)

  1. Möbus, R.; Kienzle, O.: Interface structure revieval by HREM: from entropy maximisation to R-Factor fits. In: Electron Microscopy and Analysis 1999, S. 263 - 266 (Hg. Kiely, C. J.). Electron Microscopy and Analysis 1999, Sheffield, 24. August 1999 - 27. August 1999. Institute of Physics Publ., Bristol (1999)
  2. Näfe, H.; Gollhofer, S.; Aldinger, F.: Mixed ionic-electronic conduction of Na-beta-alu mina under the conditions of a potentiometric CO2 sensor. In: Solid State Ionics V, S. 521 - 526 (Hg. Nazri, G.-A.; Julien, C.; Rougler, A.). Symposium at the Materials Research Society Fall Meeting, Boston, 30. November 1998 - 04. Dezember 1998. Materials Research Society, Warrendale, PA (1999)
  3. Ritsch, S.; Hiraga, K.; Gödecke, T.; Lück, R.: Phase transformations in decagonal Al-Co-Ni quasicrystals studied by TEM. In: Proceedings of the International Conference on Solid-Solid Transformations '99 (JIMIC 3), S. 1341 - 1344. Solid-Solid Transformations '99 (JIMIC 3), Kyoto, Japan, 24. April 1999 - 28. April 1999. Japan Institute of Metals, Sendai (1999)
 
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