@article{escidoc:0114, title = {{Focused ion beam micromachining enables novel optics for X-ray microscopy}}, author = {Keskinbora, K. and Sanli, U. and Gr\'event, C. and Hirscher, M. and Sch\"utz, G.}, journal = {{Microscopy and Microanalysis}}, volume = {21}, number = {Suppl 3}, pages = {1983--1984}, publisher = {Springer-Verlag New York}, address = {New York, NY}, year = {2015}, doi = {10.1017/S1431927615010697} }