Atomic force microscope probe based controlled pushing for nano-tribological characterization
2003
Article
pi
Author(s): | Sitti, Metin |
Journal: | IEEE/ASME Transactions on Mechatronics |
Volume: | 8 |
Number (issue): | 3 |
Year: | 2003 |
Department(s): | Physische Intelligenz |
Bibtex Type: | Article (article) |
BibTex @article{sitti2003atomic, title = {Atomic force microscope probe based controlled pushing for nano-tribological characterization}, author = {Sitti, Metin}, journal = {IEEE/ASME Transactions on Mechatronics}, volume = {8}, number = {3}, year = {2003}, doi = {} } |